主题：Infrared near-fieldmicroscopy for nanoscalecharacterization

时间：2026年10月30日（周五）下午：14：30—17：30

地点：深圳技术大学院B2-A801会议室

演讲嘉宾：叶戈尔·格雷戈里·安德烈耶夫博士(Egor "Gregory" Andreev, Ph.D.)

主讲人简介(About the speaker)：

叶戈尔格雷戈里安德烈耶夫(Gregory Andrev)博士，近场光学领域的独立研究员与创业者。他在加州大学圣地亚分校Dimiti Basov教授的红外纳米显微课题组获得博士学位，期间合著了二氧化钒金属一绝缘体相变的近场研究(Science 2007)，首次以10 nm分辨率记录了数纳米厚二氧化硅薄膜的红外光谱(Phys. Rev. B2012)，并参与了石墨烯等高激元的成像工作(Nano Letters 2011; Nature 2012)。此后，他为多家公司以及自己创办的初创公司设计了近场显微仪器。他拥有20余项专利，其中包括他在Meta Reality Labs担任光学科学家期间完成的全息光学元件相关发明。

Gregory Andreey, Ph.D., is an ndependent researcher and startup entrepreneur in near-field optics. He earned his Ph.D. from Dimitri Basov's infrarednanoscopy group at UC San Diego, where he co-authored the near-field studies of the metal to insulator transition in VO2 (Science 2007) recorded the first 10 nm resolution IR spectra of few-nanometer slicon dioxide films (Phys Rev B 2012), and also contributed to the imaging of graphene plasmons (NanoLetters 2011; Nature 2012). Since then, he has designed near-field microscopyinstruments for several companies as well as his own startup. He is also the holder of over 20 patents, which also include inventions related to Holographic Optical Elements during his work at Meta Reality Labs as an Optical Scientist.

讲座内容摘要：

In scattering-type near-field microscopy (s-SNOM), a sharp metal tip illuminated by infrared light probes the sample below with evanescent waves, which produce signals in the tip's scattered light related to both the real and the imaginary part of the sample's infrared optical constants. The resulting images show nanoscale resolution and monolayer thickness sensitivity. In this talk I will show data that demonstrates these capabilities on oxide samples with layers as thin as 2nm and on single atomic layers of graphene. I will also discuss how s-SNOM the large spatial frequencies (in-plane k) generated in this technique enabled the first images of graphene plasmons, as they formed an interference pattem through 2D reflections from anearby interface. These patterns enabled characterization of the plasmons: the fringe period gives the plasmon wavelength, a gate voltage tunes it, while a series of images traces the dispersion. The same signals read carrier density in doped silicon without electrical contacts, and the free-carrier response is resonantly enhanced in the near field, far beyond what far-field methods such as FTIR return. Lastly, the nanoscale IR response also identifies materials by their vibrational fingerprint: the carbonyl band near 1730 cm-1, for instance, is shared by PMMA and the ester-based 193 nm photoresists, and I will show data separating two polymers at 10 nm. Along the way I will describe how the instrument is built: how a tapping tip and an interferometer separate the small near-field signal from a much larger background and return reflection and absorption images in one scan, and the systems I built on this principle.

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